The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2016

Filed:

Jun. 22, 2010
Applicants:

Kazuo Nishi, Kanagawa, JP;

Naoto Kusumoto, Kanagawa, JP;

Inventors:

Kazuo Nishi, Kanagawa, JP;

Naoto Kusumoto, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/0236 (2006.01); H01L 31/0224 (2006.01); H01L 31/0352 (2006.01); H01L 31/075 (2012.01); H01L 31/20 (2006.01); H01L 31/046 (2014.01);
U.S. Cl.
CPC ...
H01L 31/022433 (2013.01); H01L 31/02363 (2013.01); H01L 31/035281 (2013.01); H01L 31/046 (2014.12); H01L 31/075 (2013.01); H01L 31/202 (2013.01); Y02E 10/548 (2013.01); Y02P 70/521 (2015.11);
Abstract

A stack including a first electrode, a first impurity semiconductor layer having one conductivity type, an intrinsic semiconductor layer, a second impurity semiconductor layer having an opposite conductivity type to the one conductivity type, and a light-transmitting second electrode is formed over an insulator. The light-transmitting second electrode and the second impurity semiconductor layer have one or more openings. The shortest distance between one portion of the wall of one opening and an opposite portion of the wall of the same opening at the level of the interface between the second impurity semiconductor layer and the intrinsic semiconductor layer is made smaller than the diffusion length of holes in the intrinsic semiconductor layer. Thus, recombination is suppressed, so that more photocarriers are generated due to the openings and taken out as current, whereby conversion efficiency is increased.


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