The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2016

Filed:

Feb. 13, 2015
Applicants:

Yong-don Kim, Suwon-si, KR;

Se-jin Park, Yongin-si, KR;

Inventors:

Yong-Don Kim, Suwon-si, KR;

Se-Jin Park, Yongin-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-Si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01); H01L 29/06 (2006.01); H01L 21/225 (2006.01); H01L 29/36 (2006.01); H01L 29/66 (2006.01); H01L 21/761 (2006.01); H01L 29/10 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7816 (2013.01); H01L 21/2253 (2013.01); H01L 21/761 (2013.01); H01L 29/0623 (2013.01); H01L 29/0646 (2013.01); H01L 29/0696 (2013.01); H01L 29/1083 (2013.01); H01L 29/36 (2013.01); H01L 29/66659 (2013.01); H01L 29/7835 (2013.01); H01L 29/0653 (2013.01);
Abstract

A semiconductor device includes at least one gate electrode on a substrate structure, at least one drain region doped with impurities of a first conductivity type, a first well region doped with impurities of the first conductivity type under the at least one drain region, and at least one source region doped with impurities of the first conductivity type. The device also includes a first barrier impurity region and a second barrier impurity region. The first barrier impurity region is doped with impurities of the first conductivity type and electrically insulating upper and lower portions of the substrate structure from each other. The second barrier impurity region is doped with impurities of a second conductivity type. A portion of the second barrier impurity region has an uneven shape and overlaps the at least one drain region.


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