The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2016
Filed:
Oct. 05, 2010
Alessandro Chini, Modena, IT;
Umesh K. Mishra, Montecito, CA (US);
Primit Parikh, Goleta, CA (US);
Yifeng Wu, Goleta, CA (US);
Alessandro Chini, Modena, IT;
Umesh K. Mishra, Montecito, CA (US);
Primit Parikh, Goleta, CA (US);
Yifeng Wu, Goleta, CA (US);
The Regents of the University of California, Oakland, CA (US);
Cree, Inc., Durham, NC (US);
Abstract
A process for fabricating single or multiple gate field plates using consecutive steps of dielectric material deposition/growth, dielectric material etch and metal evaporation on the surface of a field effect transistors. This fabrication process permits a tight control on the field plate operation since dielectric material deposition/growth is typically a well controllable process. Moreover, the dielectric material deposited on the device surface does not need to be removed from the device intrinsic regions: this essentially enables the realization of field-plated devices without the need of low-damage dielectric material dry/wet etches. Using multiple gate field plates also reduces gate resistance by multiple connections, thus improving performances of large periphery and/or sub-micron gate devices.