The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2016
Filed:
Apr. 24, 2013
Herbert Bruder, Hoechstadt, DE;
Harald Schöndube, Erlangen, DE;
Herbert Bruder, Hoechstadt, DE;
Harald Schöndube, Erlangen, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method is disclosed for the reconstruction of image data of an object under examination from measured data, wherein the measured data has been acquired during a relative rotational movement between a radiation source of a computed tomography system and the object under examination. A delimited area between the radiation source and a detector represents a field of view, in respect of which measured data can be acquired. During the measured data acquisition, parts of the object under examination were located at least partly outside of the field of view. A reconstruction is carried out of first image data from the measured data. The first image data is modified via a threshold value comparison, and the modified data is processed with a morphological filter, and projection data is calculated. The measured data is modified using the projection data, and, second image data is reconstructed.