The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2016
Filed:
Jul. 30, 2013
Dijia Wu, North Brunswick, NJ (US);
Neil Birkbeck, Sunnyvale, CA (US);
Michal Sofka, Franklin Park, NJ (US);
Meizhu Liu, Plainsboro, NJ (US);
Shaohua Kevin Zhou, Plainsboro, NJ (US);
Dijia Wu, North Brunswick, NJ (US);
Neil Birkbeck, Sunnyvale, CA (US);
Michal Sofka, Franklin Park, NJ (US);
Meizhu Liu, Plainsboro, NJ (US);
Shaohua Kevin Zhou, Plainsboro, NJ (US);
Siemens Product Lifecycle Management Software Inc., Plano, TX (US);
Abstract
Multiple object segmentation is performed for three-dimensional computed tomography. The adjacent objects are individually segmented. Overlapping regions or locations designated as belonging to both objects may be identified. Confidence maps for the individual segmentations are used to label the locations of the overlap as belonging to one or the other object, not both. This re-segmentation is applied for the overlapping local, and not other locations. Confidence maps in re-segmentation and application just to overlap locations may be used independently of each other or in combination.