The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2016

Filed:

Jun. 14, 2013
Applicant:

National Institute of Advanced Industrial Science and Technology, Chiyoda-ku, Tokyo, JP;

Inventors:

Hideyuki Tanaka, Tsukuba, JP;

Yasushi Sumi, Tsukuba, JP;

Yoshio Matsumoto, Tsukuba, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/262 (2006.01); G06K 9/32 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0044 (2013.01); G06K 9/3216 (2013.01); G06K 2009/3225 (2013.01); G06T 2207/30204 (2013.01);
Abstract

A pose detecting system includes: a marker using a microlens array; a camera; and a computer receiving a marker image. The marker includes: a lens area constituted of the microlens array and a mark array having a plurality of marks arrayed with a pitch similar to that between a plurality of lenses constituting the microlens array so as to produce a moiré pattern; and four reference points. The computer performs: determining the pose of the marker based on the four reference points; analyzing the moiré pattern so as to calculate an angle formed by the marker and a straight line connecting the center of an integrated mark that emerges at the lens area as the moiré pattern and is similar in shape to each of the plurality of marks to a viewpoint at the marker; and correcting the pose of the marker by using the angle.


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