The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2016

Filed:

Mar. 14, 2014
Applicant:

The University of North Carolina AT Chapel Hill, Chapel Hill, NC (US);

Inventors:

Chen-Rui Chou, Raleigh, NC (US);

Stephen Pizer, Chapel Hill, NC (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G06T 11/00 (2006.01); G06T 15/08 (2011.01);
U.S. Cl.
CPC ...
G06T 7/0034 (2013.01); G06T 7/0028 (2013.01); G06T 7/0032 (2013.01); G06T 11/003 (2013.01); G06T 15/08 (2013.01); G06T 2200/04 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20116 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30061 (2013.01); G06T 2207/30096 (2013.01); G06T 2211/428 (2013.01);
Abstract

Methods, systems, and computer readable media for real-time 2D/3D deformable registration using metric learning are disclosed. According to one aspect, a method for real-time 2D/3D deformable registration using metric learning includes creating a catalog of simulated 2D projection images based on a reference 3D image and a shape space of 3D deformations, where each entry in the catalog is created by: applying to the reference 3D image a set of deformation parameters from the shape space of deformations; simulating a 2D projection of the result; associating the simulated 2D projection image with the deformation parameters used to create the simulated 2D projection image; and storing the simulated 2D projection image and associated deformation parameters in the catalog. The method also includes receiving a 2D image, and, in response to receiving the 2D image: calculating a value of distance between the received 2D image and a simulated 2D projection image for each of the simulated 2D projection images in the catalog; using the calculated distances to calculate weighting factors to be applied to the deformation parameters of each of the simulated 2D projection images in the catalog; and calculating deformation parameters for the received 2D image based on the weighted deformation parameters in the catalog. The calculated deformation parameters are then used to deform a 3D volume of interest to produce a 3D volume that represents the 3D layout of the tissue at the time that the received 2D image was acquired.


Find Patent Forward Citations

Loading…