The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2016
Filed:
Nov. 21, 2013
The Trustees of Columbia University IN the City of New York, New York, NY (US);
Andreas H. Hielscher, Brooklyn, NY (US);
Hyun Keol Kim, Cresskill, NJ (US);
Ludguier D. Montejo, New York, NY (US);
THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK, New York, NY (US);
Abstract
Systems, methods, and devices for image reconstruction using combined PDE-constrained and simplified spherical harmonics (SPN) algorithm are presented herein. SPN equations can be used as the forward model in diffuse optical tomography (DOT) and employed in a PDE-constrained reduced space sequential quadratic programming (rSQP) optimization method to reconstruct spatially distributed optical properties, such as absorption, scattering, fat, oxygenated hemoglobin, de-oxygenated hemoglobin, fluorescent concentration, quantum yield, etc. The SPN algorithm with the PDE-constrained rSQP optimization method allows for DOT imaging that uses significantly less computational resources (e.g., time and random-access memory (RAM)) than methods employing the equation of radiative transfer (ERT). The techniques disclosed herein allow for more expeditious image processing as well as the potential for clinical diagnosis using DOT imaging. Diagnosis can be performed by a computer-aided diagnosis (CAD) system, which can provide clinically relevant analysis and interaction shortly after patient imaging.
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