The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2016

Filed:

Jun. 13, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Tsuyoshi Ide, Tokyo, JP;

Tetsuro Morimura, Tokyo, JP;

Bin Tong, Fukuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A47G 9/06 (2006.01); G06F 17/18 (2006.01); G06K 9/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); G06K 9/00536 (2013.01); G06K 9/6284 (2013.01);
Abstract

A method providing an analytical technique introducing label information into an anomaly detection model. Effective utilization of label information is based on introducing the degree of similarity between samples. Assuming, for example, there is a degree of similarity between normally labeled samples and no similarity between normally labeled and abnormally labeled samples. Also each sensor value is generated by the linear sum of a latent variable and a coefficient vector specific to each sensor. However, the magnitude of observation noise is formulated to vary according to the label information for the sensor values, and set so that normal label≦unlabeled≦anomalously labeled. A graph Laplacian is created based on the degree of similarity between samples, and determines the optimal linear transformation matrix according to a gradient method. A optimal linear transformation matrix is used to calculate an anomaly score for each sensor in the test samples.


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