The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2016
Filed:
Mar. 17, 2014
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Akinori Araya, Kanagawa, JP;
Yohei Kuwabara, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
Brightness information with a wide dynamic range is acquired and observed while preventing degradation of a detector. The invention provides a microscope system including a scanner that two-dimensionally scans laser light emitted from a light source unit on a specimen; a detector () that detects light from the specimen on which the laser light is scanned by the scanner and outputs a light intensity signal corresponding to the light intensity of the detected light; a PC that converts the light intensity signal output from the detector () to brightness information at each pixel corresponding to the scanning position of the scanner and that generates an image of the specimen; a second integrating circuit () that calculates an integrated value corresponding to the total light intensity signal output from the detector () within a given time; a comparator () that determines whether or not that integrated value of a voltage signal exceeds a prescribed threshold; and a high-voltage control portion () that stops detection of light by the detector () when it is determined by the comparator () that the voltage signal exceeds the prescribed threshold.