The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2016

Filed:

Aug. 22, 2014
Applicant:

The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);

Inventors:

Oleg Rumyantsev, Stanford, CA (US);

Mark Schnitzer, Palo Alto, CA (US);

Jerome Anthony-Jean Lecoq, Menlo, CA (US);

Tong Zhang, Palo Alto, CA (US);

Hyun Kim, Menlo Park, CA (US);

Joan Savall, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/00 (2006.01); G02B 21/16 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G02B 21/002 (2013.01); G01N 21/6458 (2013.01); G02B 21/16 (2013.01);
Abstract

A multi-foci laser scanning microscope generates a set of time-multiplexed beams that are simultaneously scanned over multiple scan areas of the sample to be observed. A photodetector array associated with the beams detect fluorescence signals from the sample. A processor processes output signals from the photodetector array based on the time-multiplexing of the beams to provide a much wider field of view and reduced crosstalk between neighboring scan areas for more accurate imaging.


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