The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2016

Filed:

Mar. 28, 2014
Applicant:

Mitsubishi Electric Corporation, Chiyoda-ku, Tokyo, JP;

Inventors:

Kazuhiro Eguchi, Tokyo, JP;

Kenichi Moteki, Tokyo, JP;

Assignee:

MITSUBISHI ELECTRIC CORPORATION, Chiyoda-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/16 (2006.01); G21C 17/003 (2006.01);
U.S. Cl.
CPC ...
G01T 1/16 (2013.01); G21C 17/003 (2013.01);
Abstract

A radiation monitor includes a high-energy count-rate-measurement functional unit, a low-energy count-rate-measurement functional unit, and an alert-diagnosis functional unit. The alert-diagnosis functional unit receives an alert from the high-energy count-rate-measurement functional unit, receives a low-energy count rate from the low-energy count-rate-measurement functional unit, determines whether or not the low-energy count rate is in a set acceptable range by performing synchronizing with alert transmission, determines that the alert is caused by fluctuation, when the low-energy count rate is in the acceptable range, determines that the alert is caused by any of an increase in the γ ray which is a measurement target or enter of noise, when the low-energy count rate is increased beyond the acceptable range, and outputs results of determination.


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