The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2016

Filed:

Sep. 16, 2013
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventor:

Soon Il Yeo, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G01R 31/00 (2006.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 31/002 (2013.01); G01R 29/0814 (2013.01); G01R 29/0835 (2013.01); G01R 31/001 (2013.01);
Abstract

Provided is an electromagnetic interference (EMI) measuring device. The EMI measuring device according to the present invention includes an electromagnetic wave eliminating unit eliminating remaining electromagnetic waves from a DUT in response to an eliminating control signal of the control unit. The control unit may calculate EMI of the DUT on the basis of a measured result measured before the elimination of remaining electromagnetic waves. The EMI measuring device according to the present invention may compensate for an error due to remaining electromagnetic waves and measure EMI at high accuracy.


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