The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2016
Filed:
Jan. 29, 2013
Sysmex Corporation, Kobe, JP;
Junzo Yamamoto, Kobe, JP;
Shigeo Kanamori, Kobe, JP;
Fumio Inoue, Kobe, JP;
Ikuya Takenaka, Kobe, JP;
Osamu Hirota, Kobe, JP;
SYSMEX CORPORATION, Kobe, JP;
Abstract
Provided is a sample processing apparatus management system, sample processing apparatuses and a management apparatus, and a management method that can accurately and easily adjust the respective sample processing apparatuses irrespective of their individual differences. When abnormality has occurred in a sample analyzer, the sample analyzer requests approval for self-adjustment from a management server. The management server determines whether to permit performance of the self-adjustment, and when having determined to permit the self-adjustment, notifies the sample analyzer of the approval for the self-adjustment. When the approval for the self-adjustment has been notified of, the sample analyzer performs the self-adjustment.