The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2016
Filed:
Oct. 25, 2010
Kayoko Kawata, Tokyo, JP;
Masaaki Kurokawa, Tokyo, JP;
Masayoshi Higashi, Tokyo, JP;
Masaya Takatsugu, Tokyo, JP;
Yoshihiro Asada, Tokyo, JP;
Kayoko Kawata, Tokyo, JP;
Masaaki Kurokawa, Tokyo, JP;
Masayoshi Higashi, Tokyo, JP;
Masaya Takatsugu, Tokyo, JP;
Yoshihiro Asada, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
Noise included in detection signals is distinguished with a simple configuration. Provided is a flaw-detection apparatus () including a flaw-detection sensor group () in which two flaw-detection sensors (and) are arranged substantially in one row in a scanning direction with a distance therebetween and a processing device () that detects a defect in an inspection object on the basis of detection signals detected by the individual flaw-detection sensors (and), wherein, with regard to the detection signals detected by the flaw-detection sensors (and), when signal values detected at substantially a same positional coordinate in the scanning direction are not similar to each other, and, additionally, when signal values measured at a same time are similar to each other, the processing device () determines that the detection signals are not defect signals.