The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2016
Filed:
Sep. 26, 2011
Anis Redha Hadj Henni, Montreal, CA;
Cedric Rene Schmitt, Montreal, CA;
Anis Redha Hadj Henni, Montreal, CA;
Cedric Rene Schmitt, Montreal, CA;
VAL-CHUM, LIMITED PARTNERSHIP, Montreal, CA;
Abstract
A system for dynamically measuring viscoelasticity of material samples using shear wave induced resonance, the system comprising: i) an apparatus comprising a vibration source; a vibration detector; a processor, and a user interface, for example to select a sample holder configuration, and ii) a rigid sample holder connectable to the vibration source, wherein the vibration source generates shear waves that induce vibrations and the resonance of a sample through the holder, the vibration sensor measuring the sample vibrations and resonance, and the processor determining the viscoelasticity of the sample from the vibrations or resonances and from the selected sample holder configuration. Multiple measurement modalities using the system to study materials viscoelasticity as function of time parameters; temperature parameters; strain parameters; repetition parameters and mapping parameters.