The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2016
Filed:
Mar. 18, 2013
Samsung Electronics Co., Ltd., Suwon-si, KR;
Dong Goo Kang, Suwon-si, KR;
Sung Hoon Kang, Suwon-si, KR;
Sung Su Kim, Yongin-si, KR;
Young Hun Sung, Hwaseong-si, KR;
Hyun Hwa Oh, Hwaseong-si, KR;
Seok Min Han, Seongnam-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
An apparatus and method for acquiring an optimal MEX image may include an X-ray source to generate an X-ray and to irradiate the X-ray, an energy identification detector to acquire a MEX image that is generated when the irradiated X-ray penetrates an object, and an optimal MEX processor to generate an optimal MEX parameter based on a characteristic of the object and to control at least one of the X-ray source and the energy identification detector based on the generated optimal MEX parameter.