The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2016
Filed:
Jan. 30, 2012
Ralf Ebersbach, Schmoelln, DE;
Martin Hacker, Jena, DE;
Ralf Ebersbach, Schmoelln, DE;
Martin Hacker, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
Optimized device for swept source optical coherence domain reflectometry and tomography. In the coherence-optical device, light, with the aid of an interferometer, is used for distance-measuring and imaging purposes on reflecting and scattering areas of the human eye. The optimized device according to the invention consists of includes a tunable light source, matched to the sought-after measurement region ZOCT, with a resonator length LR, an interferometric measurement arrangement, a data capturing unit for capturing the light portions scattered back from the sample and a data processing unit. Here the resonator length LR of the tunable light source is matched not only to the sought-after measurement region ZOCT, but also to the entire interferometric measurement arrangement such that disturbance points present in the interferometric measurement arrangement cannot create disturbance signals in the sought-after measurement region ZOCT.