The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2016
Filed:
Jun. 05, 2012
Jens Franke, Germering, DE;
Florian Lang, Gilching, DE;
Michael Simon, Woerth, DE;
Bjoern Coenen, Munich, DE;
Markus Niedl, Wolfratschausen, DE;
Ronald Tonn, Woerthsee, DE;
Johannes Steffens, Rosenheim, DE;
Jens Franke, Germering, DE;
Florian Lang, Gilching, DE;
Michael Simon, Woerth, DE;
Bjoern Coenen, Munich, DE;
Markus Niedl, Wolfratschausen, DE;
Ronald Tonn, Woerthsee, DE;
Johannes Steffens, Rosenheim, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A measuring device for measuring a signal with a first component signal and at least one second component signal comprises a high-frequency processing device, which is embodied to mix the signal in order to form an intermediate-frequency signal and to digitize the latter in order to form a digital composite signal. The measuring device further comprises a digital mixer, which is embodied to generate a first digital composite test signal and a second digital composite test signal subject to a displacement of the frequency of the digital composite signal. Moreover, the measuring device comprises a digital filter, which is embodied to filter the first digital composite test signal in order to form a first digital test signal and to filter the second digital composite test signal in order to form a second digital test signal.