The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2016
Filed:
May. 31, 2014
Apple Inc., Cupertino, CA (US);
Joseph Ding-Jiu Huang, Kingston, CA;
Abhinav R. Patel, Mountain View, CA (US);
Darin Tay, Sunnyvale, CA (US);
David Benjamin Millman, Mountain View, CA (US);
Jessica Noel Tsoong, Palo Alto, CA (US);
Robert Mayor, Half Moon Bay, CA (US);
Vitali Lovich, San Jose, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Methods, systems, and computer program product for location determination using dual statistical filters are described. A mobile device can determine a location of the mobile device using a particle filter and a Kalman filter. The particle filter can filter candidate locations of the mobile device using measurements of environment variables in the venue. The Kalman filter can filter inputs from a sensor of the mobile device for measuring angular movement of the mobile device. The particle filter and the Kalman filter can be linked by heading of the mobile device. Output of the Kalman filter can be used to determine where to place particles, or candidate locations, in a next iteration of the particle filter. Output from the particle filter can be used to determine a center mode of the Kalman filter and to determine a bias of the sensor for measuring angular movement.