The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2016

Filed:

Nov. 26, 2014
Applicant:

Omnivision Technologies, Inc., Santa Clara, CA (US);

Inventor:

Robert Johansson, Oslo, NO;

Assignee:

OmniVision Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/378 (2011.01); H04N 5/357 (2011.01); H03M 1/06 (2006.01);
U.S. Cl.
CPC ...
H04N 5/378 (2013.01); H03M 1/0634 (2013.01); H04N 5/3575 (2013.01);
Abstract

A method of implementing Correlated Multi-Sampling (CMS) in an image sensor with improved analog-to-digital converter (ADC) linearity starts with an ADC circuitry included in a readout circuitry that generates a plurality of uncorrelated random numbers used as a plurality of ADC pedestals for sampling image data. A Successive Approximation Register (SAR) included in the ADC circuitry stores a different one of the ADC pedestals before each sampling of the image data. The ADC circuitry samples an image data from a row a plurality of times against plurality of ADC pedestals to obtain a plurality of sampled input data. The ADC circuitry converts each of the plurality of sampled input data from analog to digital, which includes performing a binary search using the SAR. Other embodiments are also described.


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