The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2016

Filed:

Dec. 30, 2013
Applicant:

Atc Logistics & Electronics, Inc., Fort Worth, TX (US);

Inventor:

Jimmie Paul Partee, Double Oak, TX (US);

Assignee:

ATC Logistics & Electronics, Inc., Fort Worth, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/00 (2013.01); H04B 17/00 (2015.01); H04L 12/26 (2006.01); H04H 20/12 (2008.01);
U.S. Cl.
CPC ...
H04B 17/00 (2013.01); H04H 20/12 (2013.01); H04L 43/045 (2013.01); H04L 43/50 (2013.01);
Abstract

A system, method, and testing station for testing wireless network devices. The testing station includes a control system configured to control parallel testing of the wireless network devices. The testing station includes one or more computing devices in communication with the control system. The one or more computing devices are configured to perform testing of each of the wireless network devices in response to commands from the control system. The testing station includes a number of testing chambers configured to isolate the wireless network devices from outside radio frequency signals.


Find Patent Forward Citations

Partee, Jimmie. (2016). Test station for testing wireless electronic devices (U.S. Patent No. 9490920). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9490920

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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