The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2016
Filed:
Feb. 12, 2014
E Ink Holdings Inc., Hsinchu, TW;
Chuan-Feng Liu, Hsinchu, TW;
Jen-Shiun Huang, Hsinchu, TW;
Pei-Lin Huang, Hsinchu, TW;
Shi-Lin Li, Hsinchu, TW;
Chen-Fa Tsai, Hsinchu, TW;
Yung-Sheng Chang, Hsinchu, TW;
E Ink Holdings Inc., Hsinchu, TW;
Abstract
An inspection method including following steps is provided. A pixel array substrate including a plurality of pixel units is in contact with a photoelectric inspection device. A plurality of electrical signals is inputted to the pixel units of the pixel array substrate and the photoelectric inspection device. Based on an optical property of the photoelectric inspection device, the pixel units of the pixel array substrate are being examined on whether they are normal or not. Moreover, an inspection apparatus realizing the inspection method is also provided.