The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2016

Filed:

Oct. 29, 2013
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yusuke Muraoka, Tokyo, JP;

Ryohei Fujimaki, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/04 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01);
Abstract

A model estimation device includes: a data input unit; a state number setting unit; an initialization unit which sets initial values of a variational probability of a latent variable, a parameter, and the type of each component; a latent variable variational probability computation unit which computes the variational probability of the latent variable so as to maximize a lower bound of a marginal model posterior probability; a component optimization unit which estimates an optimal type of each component and a parameter thereof so as to maximize the lower bound of the marginal model posterior probability separated for each component of the latent variable model; an optimality determination unit which determines whether or not to continue the maximization of the lower bound of the marginal model posterior probability; and a result output unit which outputs a result.


Find Patent Forward Citations

Loading…