The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2016
Filed:
Jul. 01, 2013
Bottomline Technologies (De), Inc., Portsmouth, NH (US);
Jerzy W. Bala, Potomac Falls, VA (US);
Bottomline Technologies (DE), Inc., Portsmouth, NH (US);
Abstract
The invention includes methods and systems for analyzing data to determine trends in the data and to identify outliers. The methods and systems include a learning algorithm whereby a data space is co-populated with artificial, evenly distributed data, and then the data space is carved into smaller portions whereupon the number of real and artificial data points are compared. Through an iterative process, clusters having less than evenly distributed real data are discarded. Additionally, a final quality control measurement is used to merge clusters that are too similar to be meaningful. The invention is widely applicable to data analytics, generally, including financial transactions, retail sales, elections, and sports.