The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2016

Filed:

May. 08, 2012
Applicant:

Yu Xu, San Diego, CA (US);

Inventor:

Yu Xu, San Diego, CA (US);

Assignee:

Teradata US, Inc., Dayton, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30498 (2013.01);
Abstract

Techniques that facilitate management of skewed data during a parallel multiple join operation are provided. Portions of tables involved in the join operation can be distributed among a plurality of processing modules, and each of the processing modules can be provided with a list of skewed values of a join column of a larger table involved in the join operation. Each of the processing modules can scan the rows of first and second tables distributed to the processing modules and compare values of the join columns of both tables with the list of skewed values. One or more of the processing modules can then redistribute the skewed values.


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