The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2016

Filed:

Jun. 29, 2012
Applicants:

Vanessa Y. Sun, Pompton Plains, NJ (US);

Neeraj Agrawal, Kenmore, WA (US);

Inventors:

Vanessa Y. Sun, Pompton Plains, NJ (US);

Neeraj Agrawal, Kenmore, WA (US);

Assignee:

Amazon Technologies, Inc., Reno, NV (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 17/30 (2006.01); G06F 17/22 (2006.01); G06F 17/27 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30011 (2013.01); G06F 17/2211 (2013.01); G06F 17/2247 (2013.01); G06F 17/272 (2013.01);
Abstract

Multiple structured documents can be compared with one another utilizing user-specified custom configurations. For example, a traversal of at least two of the documents may identify one or more potential matches in the documents. A user-defined rule may be obtained that specifies differences that are expected within the documents. Additionally, a determination may be made regarding when differences between potential matches are significant based in part on user-defined rule. In some examples, significant differences may be determined to be significant as a result of being differences, other than expected differences, that vary from the expected differences. Any significant differences can be logged, reported on or added to statistics for the new service being tested.


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