The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2016

Filed:

Dec. 20, 2012
Applicants:

Ben Wu, San Jose, CA (US);

Derek Lin, San Mateo, CA (US);

Deepesh Chaudhary, Foster City, CA (US);

Lubomir P. Petrov, San Ramon, CA (US);

Sagy Volkov, San Jose, CA (US);

Inventors:

Ben Wu, San Jose, CA (US);

Derek Lin, San Mateo, CA (US);

Deepesh Chaudhary, Foster City, CA (US);

Lubomir P. Petrov, San Ramon, CA (US);

Sagy Volkov, San Jose, CA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 17/28 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30008 (2013.01);
Abstract

Data unavailability and data loss events in a large distributed database system are predicted by proactively and substantially continuously collecting information about appliance states and operations in the database system, forming feature vectors of prescribed key information features, and classifying said feature vectors as indicative of possible DU/DL events based upon their similarity and closeness to stored historical feature vectors known to be relevant to DU/DL events.


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