The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2016

Filed:

Mar. 14, 2013
Applicants:

Gautam Pendse, Hopkinton, MA (US);

Thomas Lane, Carlisle, MA (US);

Inventors:

Gautam Pendse, Hopkinton, MA (US);

Thomas Lane, Carlisle, MA (US);

Assignee:

The Mathworks, Inc., Natick, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); G06K 9/6277 (2013.01);
Abstract

A method for modeling a set of observed data comprises selecting a reference model and an alternative model as possible descriptions of the set of observed data, and storing an index function for measuring fit of models to data. The method further includes performing, by one or more processors, a simulated threshold-fitting for a first of the two models, deriving an initial simulated index for the second model for fitting the second model to the simulated data, and deriving an initial boundary for simulated index difference including calculating a difference between the threshold-fit simulated index for the first model and the initial simulated index for the second model. The method further includes determining, based on a comparison, whether to update a counter used in calculating a simulated p-value, and selecting, based on the simulated p-value, one of the reference and alternative models for modeling the set of observed data.


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