The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2016
Filed:
Jan. 30, 2014
Nec Laboratories America, Inc., Princeton, NJ (US);
Nipun Arora, Plainsboro, NJ (US);
Hui Zhang, Princeton Junction, NJ (US);
Junghwan Rhee, Princeton, NJ (US);
Guofei Jiang, Princeton, NJ (US);
Kenji Yoshihira, Princeton Junction, NJ (US);
NEC Corporation, , JP;
Abstract
This invention provides a new mechanism for 'Hot-Tracing' using a novel placeholder mechanism and binary rewriting techniques, which leverages existing compiler flags in order to enable light-weight and highly flexible dynamic instrumentation. Broadly, I-Probe can be divided in 2 distinct workflows—1. Pre-processing (ColdPatch), and 2. Hot Tracing. The first phase is a pre-processing mechanism to prepare the binary for phase 2. The second phase is the actual hot-tracing mechanism, which allows users to dynamically instrument functions (more specifically symbols) of their choice.