The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2016

Filed:

Feb. 08, 2013
Applicant:

Nikon Corporation, Tokyo, JP;

Inventors:

Hideya Inoue, Yokohama, JP;

Hirohisa Taira, Ryugasaki, JP;

Koji Yamagaki, Yokohama, JP;

Assignee:

NIKON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G02B 27/22 (2006.01); H04N 13/00 (2006.01);
U.S. Cl.
CPC ...
G02B 27/22 (2013.01); G06K 9/00 (2013.01); H04N 13/0018 (2013.01); H04N 13/0022 (2013.01); H04N 13/0037 (2013.01);
Abstract

The perspective in the captured image is enhanced. Provided is an image processing apparatus including: a detecting section that detects a subject distance in each region of a captured image; and an image processing section that changes a distance perspective of an image of the region depending on the subject distance detected for each region of the captured image. In an example, the image processing section may increase the blue component ratio of a region whose detected subject distance is larger than a reference value. In an example, the image processing section may blur an image of a region whose detected subject distance is larger than a reference value.


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