The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2016

Filed:

Aug. 31, 2012
Applicant:

Marcus Dyba, Heidelberg, DE;

Inventor:

Marcus Dyba, Heidelberg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/18 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/18 (2013.01);
Abstract

A microscopic device provides three-dimensional localization of point-like objects and includes two imaging optics, each configured to image a same point-like object located in an object space into two separate image spaces as a focused light distribution. Two detector units are respectively associated with the imaging optics and configured to capture an analyzable light spot in detection points of a detection surface disposed in the respective image space. Each imaging optics includes an optical device that orients the focused light distributions obliquely to a detection axis such that, taking into account the detection point correspondence, the two light spots shift in opposite directions based on a z-position of the point-like object. An evaluation unit brings the detection points of the two detection surfaces into mutual pairwise correspondence and analyzes the two light spots so as to ascertain a lateral x-y position and an axial z-position of the point-like object.


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