The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2016
Filed:
Sep. 03, 2014
University of Houston System, Houston, TX (US);
Leon Thomsen, Houston, TX (US);
Rongrong Lin, Houston, TX (US);
UNIVERSITY OF HOUSTON SYSTEM, Houston, TX (US);
Abstract
A system and method for estimating seismic anisotropy of subsurface formations with high resolution. A method for determining anisotropy parameters of subsurface formations includes generating a synthetic reflectivity gather from a vertical well log. Times of a surface seismic gather are adjusted to those of the synthetic gather. Low-cut filtering is applied to the surface seismic gather. Anisotropy parameters are generated as a difference of the filtered seismic gather and the synthetic gather. An anisotropy value is assigned to each of plurality of layers of a formation based on the generated anisotropy parameters.