The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2016
Filed:
Apr. 16, 2015
Hitachi, Ltd., Tokyo, JP;
Hiroyuki Takagi, Tokyo, JP;
Isao Murata, Suita, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
Provided is an X-ray energy spectrum estimation method capable of reproducing, with high precision, information on an attenuation path to which an X-ray is irradiated, and performing, with high precision, reconstruction of an X-ray CT image by enabling high-precision estimation of spectrum of energy released from an X-ray source device. An energy spectrum estimation device () normalizes a response function, and calculates a modified efficiency matrix from the normalized response function, a detection efficiency matrix, and a measurement-system correction coefficient. The energy spectrum estimation device then calculates a particular result in accordance with a Bayesian estimation equation, without divergence, with use of the calculated modified efficiency matrix, the normalized modified efficiency matrix, and an attenuation characteristic curve obtained by a measurement circuit (). The energy spectrum () calculates an X-ray energy spectrum by dividing, by the normalized modified efficiency matrix, the particular result obtained by the Bayesian estimation equation.