The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2016

Filed:

Dec. 17, 2014
Applicant:

The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);

Inventor:

Norbert J. Pelc, Los Altos, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G01T 1/24 (2006.01); G01N 23/04 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
G01T 1/247 (2013.01); A61B 6/4241 (2013.01); G01N 23/046 (2013.01); A61B 6/032 (2013.01); A61B 6/482 (2013.01); A61B 6/483 (2013.01); A61B 6/5217 (2013.01);
Abstract

Spectral x-ray imaging using a photon counting x-ray detector (PCXD) transmits a broad spectrum x-ray beam through an object, detects the transmitted x-ray beam with the PCXD and processes the detected signals to determine material characteristics of the object using both the detected signals as a function of detector layer and the detected signals as a function of the particular energy band. Each detector layer of the multiple detector layers produces at least two signals, each signal representing a detected x-ray intensity in a particular energy band, and the depth information contained in the separate read-out channels.


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