The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2016
Filed:
Aug. 02, 2013
Raytheon Company, Waltham, MA (US);
Andrew Huard, Goleta, CA (US);
Amedeo Larussi, Oxnard, CA (US);
Kim McInturff, Santa Barbara, CA (US);
Raytheon Company, Waltham, MA (US);
Abstract
Characterizing a radiation pattern of an antenna, accurately, is needed to improve the determination of an angle arrival of a radar signal received by the antenna. Accordingly, an optimized monotonic fitting approach with corresponding method and system are provided. The approach represents an approximation of the radiation pattern as a window map having a plurality of windows. The approach finds an optimized monotonic fit of the radiation pattern by adjusting the window map, one window at a time, and testing the resulting new approximations. The approach tests whether a new approximation is a better fit then the other approximations, is monotonic, and has a minimum slope. The approach enforces monotonicity and a minimum slope for ambiguity resolution. The approach further includes calculating an angle arrival of the radar signal based on the optimized monotonic fit.