The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2016

Filed:

Apr. 24, 2015
Applicants:

Advanced Testing Technologies, Inc., Hauppauge, NY (US);

Eli Levi, Dix Hills, NY (US);

Inventors:

Richard Engel, Ridge, NY (US);

Eli Levi, Dix Hills, NY (US);

Robert Spinner, East Northport, NY (US);

Thomas Leddy, Eastport, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 1/04 (2006.01); H01R 43/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/04 (2013.01); H01R 43/00 (2013.01);
Abstract

Chassis for an automated test system including a housing and at least a first and a second backplane in the housing. The first backplane provides electrical connections for at least one functional module of a first type when engaged with the first backplane, while the second backplane provides electrical connections for at least one functional module of a second type different than the first type when engaged with the second backplane. The first and second backplanes include electrical circuitry to enable signals to be provided for the functional modules when engaged therewith. A bottom of the housing includes ducts to enable cooling of both types of functional modules when engaged with the housing.


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