The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2016
Filed:
Dec. 21, 2011
Applicants:
Zongjin LI, Hong Kong, CN;
Shengwen Tang, Hong Kong, CN;
Youyuan LU, Hong Kong, CN;
Inventors:
Assignee:
THE HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY, Hong Kong, CN;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/38 (2006.01); G01N 27/02 (2006.01); G01N 27/04 (2006.01);
U.S. Cl.
CPC ...
G01N 33/383 (2013.01); G01N 27/021 (2013.01); G01N 27/048 (2013.01);
Abstract
Measurement of the impedance and complex resistivity of a sample is used for measuring parameters resulting from a change in physical or chemical state. A variable frequency signal is provided by a transformer primary coil. A secondary coil of the transformer with a closed loop and electrically coupled said sample is monitored along with a leakage current sensor. Sampling at multiple signal frequencies is performed at the multiple signal frequencies.