The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2016
Filed:
Oct. 03, 2014
The Penn State Research Foundation, University Park, PA (US);
Joseph L. Rose, State College, PA (US);
Jason Philtron, Bellingham, WA (US);
The Penn State Research Foundation, University Park, PA (US);
Abstract
A method of inspecting a structure is disclosed. The method generally comprises selecting a search region of a dispersion curve of the structure corresponding to one or more inspection parameters. The search region comprises at least one guided wave mode activation point not located on the dispersion curve. The method further comprises activating, using an inspection system comprising at least one transducer, a plurality of activation points located within the search region of the dispersion curve and identifying an optimal activation point for the one or more inspection parameters. The optimal activation point comprises at least one of the plurality of activation points producing an optimal response for the one or more inspection parameters.