The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2016
Filed:
Nov. 03, 2014
Samsung Display Co., Ltd., Yongin, Gyeonggi-Do, KR;
Wal Jun Kim, Hwaseong-si, KR;
Seung Young Baeck, Cheonan-si, KR;
SAMSUNG DISPLAY CO., LTD., , KR;
Abstract
An inspecting apparatus includes: a stage including a top surface on which a multilayer structure comprising a first layer and a second layer is placed; a first light irradiation unit which faces a first side surface of the multilayer structure and provides light to a first side surface of the first layer or a first side surface of the second layer; an image capture unit which is on the stage, receives scattered light from the multilayer structure and generates image information of the multilayer structure from the received scattered light, and a control unit which detects foreign body information of the multilayer structure based on the image information of the multilayer structure. The scattered light comprises the light which is provided from the first light irradiation unit and is scattered within the multilayer structure.