The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2016
Filed:
Jun. 10, 2014
Applicant:
Florida Agricultural and Mechanical University, Tallahassee, FL (US);
Inventor:
Carol Y. Scarlett, Tallahassee, FL (US);
Assignee:
Florida Agricultural and Mechanical University, Tallahassee, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/23 (2006.01); G01N 21/17 (2006.01); H01S 3/106 (2006.01); H01S 3/105 (2006.01);
U.S. Cl.
CPC ...
G01N 21/23 (2013.01); G01N 21/1717 (2013.01); G01N 2021/1727 (2013.01); H01S 3/105 (2013.01); H01S 3/106 (2013.01);
Abstract
Methods and systems for determining material composition of a test sample may be provided. The test sample may be placed in a magnetic region having a magnetic field. A light beam may be directed at the test sample in the magnetic region. A birefringence in the light beam that has passed through the test sample may be detected. The material composition of the test sample may be determined based on the detected birefringence in the light beam.