The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2016

Filed:

Oct. 02, 2013
Applicant:

National University Corporation Kagawa University, Takamatsu-shi, Kagawa, JP;

Inventor:

Ichiro Ishimaru, Takamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/45 (2006.01); G01J 3/28 (2006.01); G01J 3/453 (2006.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01J 3/45 (2013.01); G01J 3/0208 (2013.01); G01J 3/0237 (2013.01); G01J 3/0256 (2013.01); G01J 3/0291 (2013.01); G01J 3/2803 (2013.01); G01J 3/4531 (2013.01); G01J 3/4532 (2013.01); G01N 2021/3595 (2013.01);
Abstract

A spectroscopic measurement device includes: a dividing optical system for dividing a measurement beam emitted from each of a plurality of measurement points located within a measurement area of an object to be measured, into a first measurement beam and a second measurement beam; an imaging optical system; an optical path length difference providing means; a detector including a plurality of pixels; a processor for acquiring an interferogram of a measurement point of the object to be measured; a conjugate plane imaging optical system located between the object to be measured and the dividing optical system; and a periodicity providing means located on the conjugate plane.


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