The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2016
Filed:
Feb. 14, 2014
Southwest Sciences Incorporated, Santa Fe, NM (US);
University of Connecticut, Farmington, CT (US);
Kristen A. Peterson, Santa Fe, NM (US);
Elias P. Rosen, Chapel Hill, NC (US);
Eric H. Jordan, Storrs-Mansfield, CT (US);
Sina Shahbazmohamadi, New York, NY (US);
Andrei B. Vakhtin, New Mexico, NM (US);
UNIVERSITY OF CONNETICUT, Farmington, CT (US);
SOUTHWEST SCIENCES INCORPORATED, Sante Fe, NM (US);
Abstract
A method for evaluating the condition of a ceramic coating deposited on a substrate comprising illuminating the ceramic coating with light, measuring the intensity of light returned from the ceramic coating as function of depth in the coating and transverse position on the coating, and analyzing the measured light intensities to obtain one or more of intensity of the light returned from the exposed coating surface relative to the intensity of light returned from the coating/substrate interface, intensity of the light returned from the coating/substrate interface relative to the intensity of light returned from the bulk of the ceramic coating, determination of roughness at the exposed surface of the ceramic coating, and determination of roughness of the interface between the ceramic coating and underlying bond coat or substrate.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile