The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 08, 2016
Filed:
Aug. 05, 2014
General Electric Company, Schenectady, NY (US);
Jiahua Fan, New Berlin, WI (US);
Jed Douglas Pack, Glenville, NY (US);
Guangzhi Cao, Madison, WI (US);
David Joseph Pitterle, Waukesha, WI (US);
Grant Morey Stevens, Cedarburg, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
An imaging system includes a computed tomography (CT) acquisition unit and a processing unit. The CT acquisition unit includes an X-ray source and a CT detector configured to collect CT imaging data of an object to be imaged. The X-ray source and CT detector are configured to be rotated about the object to be imaged and to collect a series of views of the object as the X-ray source and CT detector rotate about the object to be imaged. The processing unit is operably coupled to the CT acquisition unit and configured to control the CT acquisition unit to vary a view duration for the views of the series. The view duration for a particular view defines an imaging information acquisition period for the particular view, wherein the series of views includes a first group of views having a first view duration and a second group of views having a second view duration that is different than the first view duration.