The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 08, 2016

Filed:

Apr. 30, 2013
Applicant:

Kabushiki Kaisha Topcon, Itabashi-ku, JP;

Inventors:

Yoshikiyo Moriguchi, Itabashi-ku, JP;

Masahiro Akiba, Toda, JP;

Assignee:

KABUSHIKI KAISHA TOPCON, Itabashi-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0025 (2013.01); A61B 3/0058 (2013.01); A61B 3/10 (2013.01); A61B 3/102 (2013.01); A61B 3/14 (2013.01);
Abstract

An ophthalmologic imaging apparatus that can follow up imaging for acquiring a cross sectional image by referring to a front image of an eye acquired in the past and scanning the same position as before with light, includes: a photographing part configured to photograph the eye and acquire a front image thereof; a cross sectional image forming part configured to scan the eye with light and form a cross sectional image thereof; a storage configured to store a first front image of the eye and a second front image acquired in follow up imaging executed with referring to the first front image; an information obtaining part configured to analyze the first and second front images and obtain misregistration information between these front images; and a calculator configured to calculate an evaluation value of an error in a scanning position in the follow up imaging based on the misregistration information.


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