Rf receiver with testing capability

Abstract

An RF receiver device includes a semiconductor chip in a chip package, and a test signal generator integrated in the chip. The test signal generator generates an RF test signal including first information. An RF receiver circuit integrated in the chip receives an RF input signal, down-converts the RF input signal into an intermediate frequency (IF) or base band, and digitizes the down-converted signal to obtain a digital signal. An RF receive channel includes a coupler having first and second input ports and an output port. The output port is coupled to the input of the RF receiver circuit, the first input port receives an antenna signal and the second input port receives the test signal from the test signal generator. A signal processor is integrated in the chip and determines, during a test cycle, whether the first information in the digital signal matches a predetermined criterion.