The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2016

Filed:

May. 05, 2016
Applicant:

Hong Kong Applied Science & Technology Research Institute Company Limited, Hong Kong, HK;

Inventors:

Ho Ming (Karen) Wan, Hong Kong, HK;

Kwai Chi Chan, Hong Kong, HK;

Tin Ho (Andy) Wu, Hong Kong, HK;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/06 (2006.01); H03M 1/46 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
H03M 1/46 (2013.01); H03M 1/06 (2013.01); H03M 1/1245 (2013.01);
Abstract

A correcting asynchronous Successive-Approximation Register (SAR) analog-to-digital converter (ADC) detects and corrects metastability errors. An analog signal is synchronously sampled by a system clock, but data bits are converted asynchronously. A valid detector compares true and complement outputs of a comparator that compares the sampled voltage to a DAC voltage generated from digital test value from the SAR. Once the true and complement outputs diverge past logic thresholds, the valid detector activates a VALID signal indicating that comparison is completed. The compare result is then latched in as a data bit and the SAR advances to the next test value. Once all bits have been converted, an End-of-Conversion (EOC) is signaled. If the EOC does not occur by the end of the system clock, a metastability error is detected. The current bit that never finished comparison is forced high and all other unconverted bits are forced low.


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