The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2016
Filed:
Jul. 14, 2014
General Electric Company, Schenectady, NY (US);
Hewei Gao, Waukesha, WI (US);
Adam Cohen, Waukesha, WI (US);
Brian Edward Nett, Waukesha, WI (US);
Paavana Sainath, Oconomowoc, WI (US);
Yasuhiro Imai, Brookfield, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method is provided including acquiring imaging data of an object to be imaged from a computed tomography (CT) detector. The method also includes reconstructing the acquired imaging data into an initial reconstruction image, and performing material characterization of an image volume of the initial reconstruction image to provide a re-mapped image volume. Further, the method includes performing forward projection on the re-mapped image volume to provide forward projection data, and providing an error projection based on the forward projection data. Also, the method includes filtering at least one of the initial reconstruction image, the re-mapped image volume, the forward projection data, or the error projection. The method also includes using the error projection to update the initial reconstruction image to provide an updated reconstruction image.