The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 01, 2016

Filed:

Nov. 19, 2013
Applicant:

Toshiba Medical Systems Corporation, Otawara-shi, JP;

Inventors:

Xiaofeng Niu, Mundelein, IL (US);

Hongwei Ye, Kenosha, WI (US);

Wenli Wang, Briarcliff Manor, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01); G06T 7/60 (2006.01);
U.S. Cl.
CPC ...
G06T 11/005 (2013.01); G06T 7/606 (2013.01); G06T 2207/10104 (2013.01); G06T 2207/30172 (2013.01);
Abstract

A method and system for determining a position of a source including obtaining prompt data and related delayed data from a Positron Emission Tomography (PET) scanner, generating a sinogram from the prompt data, generating crystal efficiency correction factors by performing a normalization calibration based on the obtained delayed data, performing normalization correction on the generated sinogram based on the crystal efficiency correction factors to generate a corrected sinogram, rebinning the corrected sinogram to generate a plurality of two-dimensional sinogram slices, and determining a central axis for each of the plurality of two-dimensional sinogram slices using a center estimation process.


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