The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2016
Filed:
Oct. 27, 2011
Trent Lorne Mcconaghy, Vancouver, CA;
Joel Cooper, Saskatoon, CA;
Jeffrey Dyck, Saskatoon, CA;
Kyle Fisher, Saskatoon, CA;
Trent Lorne McConaghy, Vancouver, CA;
Joel Cooper, Saskatoon, CA;
Jeffrey Dyck, Saskatoon, CA;
Kyle Fisher, Saskatoon, CA;
SOLIDO DESIGN AUTOMATION INC., Saskatoon, CA;
Abstract
A method and system to estimate failure rates in designs. N Monte Carlo samples are drawn from the random distribution that describes process variation in the design. A subset of these samples is selected, and that subset of Nsamples are simulated (with a circuit simulator) to measure a performance value for each sample. A model is constructed, using the values of the Nprocess points as training inputs, and the corresponding Nperformance values as training outputs. The candidate Monte Carlo samples are from the N Monte Carlo samples that have not yet been simulated. Each candidate is simulated on the model to get predicted performance values, and the samples are ordered in ascending (or descending) order of the predicted performance values. Simulation of candidates samples is then begun, in that order. The sampling and simulation will stops once there is sufficient confidence that all failures are found.